An Improved Electro-Geometric Model for The 150 kV Kenten–Tanjung Api-Api High-Voltage Overhead Line (Sutt) to Enhance The Performance of The Lightning Protection System
DOI:
https://doi.org/10.55324/josr.v5i9.3411Keywords:
Lightning Protection, Sutt 150 Kv, Improved Electro-Geometric Model (IEGM), Shielding Failure, Back FlashoverAbstract
Lightning strikes remain one of the major causes of disturbances in high-voltage overhead transmission lines, particularly in tropical regions with high lightning activity, such as Indonesia. Failures caused by shielding failure and back flashover can reduce transmission reliability and lead to operational disruptions. The 150 kV Kenten–Tanjung Api-Api High-Voltage Overhead Line (SUTT) experienced lightning-related disturbances during the 2022–2025 period, indicating the need for a more accurate evaluation of its lightning protection performance. This study aims to analyze the performance of the lightning protection system and identify vulnerable towers using the Improved Electro-Geometric Model (IEGM) method. The research employed a case study approach using tower construction data, lightning strike records from the Lightning Detection System (LDS), and historical disturbance data. The analysis involved channel geometry modeling, striking distance calculations, shielding failure assessment, back flashover evaluation, and tower risk classification. The results show that the IEGM method provides a comprehensive assessment by integrating lightning characteristics, tower geometry, grounding conditions, and protection parameters. The analysis successfully identified variations in shielding performance and tower vulnerability levels along the transmission line. Several towers were classified as requiring priority improvements due to higher risks associated with shielding failure and back flashover. The study concludes that segmented IEGM analysis can be effectively applied as a decision-support tool for optimizing lightning protection systems, improving maintenance priorities, and enhancing the reliability of high-voltage transmission networks.
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Copyright (c) 2026 Salhadi Prataba, Ridha Yasser, Rudy Setiabudi
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